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Department of Atomic Energy, Govt. of India
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Surface Physics and Material Science

X ray facilities   -   VXRD

 

X ray facilities - VXRD
   
Description Versatile x-ray diffractometer (VXRD) can be used for the study of structure and morphology of single & composite thin films and multilayers containing crystalline, amorphous or both.
Manufacturer Bruker AXS, Germany [http://www.bruker-axs.de]
Model D8 Discover
Installation place & date Room # 126 & May, 2003
Source Copper sealed tube 2.2 kW power & 0.04 x 12 mm2 line focus
Goniometer 2-circle (q-2q)
Sample stage
¼-circle Eulerian Cradle
2-circlular: c (97 deg) and f (360 deg)
3-translational: X & Y (150 mm); Z (13 mm)
5’’ vacuum chuck
Knife edge collimator
Optics
Ni/C Göbel mirror: to select and enhance CuKa radiation
Optional:
4-bounce Ge 022 monochromator
2-bounce Ge 022 channel-cut analyser

Detector NaI scintillation point detector
Specification:
   
Dynamic range 107
Count rate 105s-1
Noise rate 2-10s-1
   
Typical applications :
- X-ray reflectivity and diffuse scattering for electron density profiling and determination of height-height correlation
- High angle high resolution diffraction for strain and lattice mismatch analysis
- Powder diffraction for phase and size analysis

HI-STAR area detector

Specification:
   
Field of view 11.5 cm diameter
Pixel size 105 µm
Dynamic range >106
Count rate 106 s-1 (200 cps/pixel)
Noise rate 10-5 cps/pixel
   

Typical applications :
- Microdiffraction Analysis
- Stress and Texture Analysis
- Phase Identification
- Small Angle Scattering including GISAXS for determination of size and distribution of nanoparticles in liquid or solid matrix
Chiller ERL2000 cooling water unit

 

Last Updated on Wednesday, 17 August 2016 14:38
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