Facilities
|
Microscopy
|
SPM-cum-Triboscope
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|
|
| Description |
* |
| Manufacturer |
Veeco, USA |
| Model |
NanoScope IV MMAFM |
| Sample size |
diameter < 15 mm , thickness < 5mm |
| Resolution |
2 nm gold particle separation on a carbon substrate at 30 kV in high vacuum (HV) and ESEM modes; 3.5 nm at 3 kV in low vacuum mode |
| Modes of operation |
Tapping mode/contact mode,
MFM,
STM,
CAFM,
Nanoindentation |
|
|
Last Updated on Wednesday, 17 August 2016 14:25
