SAHA INSTITUTE OF NUCLEAR PHYSICS
Department of Atomic Energy, Govt. of India
SINP Home Webmail Member Search A+ A A-
Log in
Surface Physics and Material Science
SINP Home > Facilities > Microscopy > BAM - Ellipsometer
BAM Ellipsometer


BAM Ellipsometer
Description Brewster Angle Microscope combined with Ellipsometer
Manufacturer Accurion
Model Nanofilm ep3 BAM
Laser wavelength 658 nm
Resolution 10X

 

Last Updated on Wednesday, 17 August 2016 14:27
   Sitemap
Applied Nuclear PhysicsAstroparticle Physics & CosmologyCrystallography & Molecular Biology
Chemical SciencesComputational ScienceExperimental Condensed matter Physics
High Energy Nuclear & Particle PhysicsTheoretical Condensed Matter PhysicsPlasma Physics
Nuclear PhysicsBiophysics and Structural GenomicsSurface Physics and Material Science
Theory Division


AuditoriumBuilding Maintenance (Civil)Building Maintenance (Electrical)
CanteenCAREElectron Microscopy Facility
Guest HouseLibraryMedical Unit
Synchrotron Activity   PETRA III   Photon Factory
TelephoneTransportWorkshop
   CMSComputer Section
Copyright Policy
Hyperlinking Policy
Privacy Policy
Disclaimer
Copyright © 2024 Saha Institute of Nuclear Physics. All Rights Reserved. Designed & Developed by UCDS