SAHA INSTITUTE OF NUCLEAR PHYSICS
Department of Atomic Energy, Govt. of India
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Surface Physics and Material Science
BAM Ellipsometer


BAM Ellipsometer
Description Brewster Angle Microscope combined with Ellipsometer

Manufacturer Accurion

Model Nanofilm ep3 BAM

Laser wavelength 658 nm

Resolution 10X

 

Last Updated on Wednesday, 17 August 2016 14:27
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