SAHA INSTITUTE OF NUCLEAR PHYSICS
Department of Atomic Energy, Govt. of India
Facilities
| Microscopy | VT-UHV-SPM |
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| Description |
The variable-temperature ultra-high-vacuum scanning probe microscope (VT-UHV-SPM) operates for both top-surface imaging and local spectroscopy across a wide temperature range in UHV. Features can also be grown or modified in the analysis chamber for the above studies. |
| Manufacturer | Omicron NanoTechnology, Germany |
| Model | VT Beam Deflection AFM |
| Installation place & date | Room # 126 & May, 2004 |
| Key Features |
UHV (10-10 mbar) STM: Tunneling current AFM Contact: Cantilever distortion AFM Non-contact: Resonance frequency shift Temperature range: 25-1500 K Scan range: 10 µm X 10 µm (max) Z-range: 1.5 µm; Resolution better than 0.01 nm |