SAHA INSTITUTE OF NUCLEAR PHYSICS
Department of Atomic Energy, Govt. of India
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Electron Microscopy

FEI TEM

FEI TEM The instrument was installed in the year 2006. Users from different Institutes and Universities are coming here to study their samples.

Key feature

Make: FEI
Model: Tecnai S-twin
Resolution: 0.24 nm.
Acc. Voltage: 200 KV
Magnification: 50X to 1100,000X
Spot size: 3nm. To 400nm.
Specimen tilt: ±40°
Embedded CCD camera
Low Dose facility for biological samples
3-D imaging

The instrument was installed in the year 2006. Users from different Institutes are coming here to study their samples.

 

Last Updated on Wednesday, 17 August 2016 11:47

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