Sangam Banerjee
| Professor | ||
| Room No | : | 3320 |
| Ext. | : | 3328 |
| Email id | : | sangam.banerjee[AT]saha.ac.in |
| Division | : | |
| Centre | : | |
Papers in Journals 61. Title : Determination of density profile of ultrathin SiO2/Si3N4/SiO2/Si(001) multilayer structures using x-ray reflectivity technique
Author(s) : Sangam Banerjee , S Ferrari, R Piagge, S Spandoni.
Source : Appl. Phys. Lett. Volume: 84 Issue: Pages: 3798 Published: 2004
62. Title : Layering of ultrathin SiO2 film and study of its growth kinetic
Author(s) : N Gayathri, Sangam Banerjee .
Source : Appl. Phys. Lett. Volume: 84 Issue: Pages: 5192 Published: 2004
63. Title : Structural, optical, and electrical characterization of gadolinium oxide films deposited by low-pressure metalorganic chemical vapor deposition
Author(s) : M P Singh, C S Thakur, K Shalini, Sangam Banerjee , N Bhat, S A Shivashankara.
Source : J. Appl. Phys. Volume: 96 Issue: Pages: 5631 Published: 2004
64. Title : Observation of pseudo-gap and Kondo behaviour in Al70Pd30-xMnx quasicrystals
Author(s) : Gayathri N Banerjee, Sangam Banerjee , R Goswami.
Source : J. Non-Cryst. Solids Volume: 334-335 Issue: Pages: 388 Published: 2004
65. Title : Recent advances in characterization of ultra-thin films using specular X-ray reflectivity technique
Author(s) : Sangam Banerjee , S Ferrari, D Chateigner, A Gibaud.
Source : Thin Solid Films Volume: 450 Issue: Pages: 23 Published: 2004
66. Title : Metrology issues in thin ONO stacks measurements by spectroscopic ellipsometry and X-ray reflectivity
Author(s) : E Bellandi, A Elbaz, S Spadoni, R Piagge, C Coccorese, G Pavia, S Ferrari, Sangam Banerjee , S Gayen, M Alessandri.
Source : Thin Solid Films Volume: 450 Issue: Pages: 120 Published: 2004
67. Title : Point contact spectroscopy of Al70Pd30-xMnx quasicrystals
Author(s) : Gayathri N Banerjee, Sangam Banerjee , R Goswami.
Source : J. Phys.: Condensed Matter Volume: 15 Issue: Pages: 2317 Published: 2003
68. Title : Early growth stages of sputter deposited Ag on native SiO< sub> 2
Author(s) : Sangam Banerjee , Srinanda Kundu .
Source : Surface Science Volume: 537 Issue: 1 Pages: 153-160 Published: 2003
69. Title : Evidence of swelling of SiO2 on thermal annealing
Author(s) : Sangam Banerjee , S Chakraborty, P T Lai.
Source : Appl. Phys. Lett. Volume: 80 Issue: Pages: 3075 Published: 2002
70. Title : Study on the effect of plasma treatment on TiN films in N2/H2 atmosphere using x-ray reflectivity and secondary ion mass spectroscopy
Author(s) : Sangam Banerjee , A Gibaud, D Chateigner, S Ferrari, C Wiemer, D T Dekadjevi.
Source : Appl. Phys. Lett. Volume: 80 Issue: Pages: 512 Published: 2002