Surface Physics Divison

Thursday, September 09 2010

Research

Description

Variable temperature ultra high vacuum scanning probe microscope (VT-UHV-SPM) works both for top surface imaging and local spectroscopy in wide temperature range and in UHV. Feature can also be grown or modified in the analysis chamber for the above studies.

Manufacturer

Omicron NanoTechnology, Germany [http://www.omicron-instruments.com]

Model

VT Beam Deflection AFM

Installation place & date

Room # 126 & May, 2004

Chambers

AFM chamber and Analysis chamber

System base pressure

UHV (10^-10 mbar)
Turbo backed by rotary pump
Ion pump with TSP

Multi-mode operation

STM: Tunneling current
AFM Contact: Cantilever distortion
AFM Non-contact: Resonance frequency shift

Temperature range

25-1500 K (in measurement chamber)
Room-25 K using cooling sample plate & LHe
Room-1500 K using direct heating sample plate
Room-750 K using resistive heating sample plate
300 – 1500 K (in manipulator)

Scanner

Single tube scanner
Scan range: 10 µm X 10 µm (max)
Z-range: 1.5 µm; Resolution better than 0.01 nm

Sample size

3 mm X 9 mm X 2 mm (for VT Compatibility)
12 mm X 12 mm X 2 mm (for others)

STM tip

Wire made of Platinum-Iridium or Tungsten

AFM cantilevers

Silicon or Silicon nitride (Si₃N₄)

Typical Contact cantilever


Material	: Silicon
Dimensions	: 450 µm X 50 µm
Force constant	: 0.3 N/m
Resonance freq	: ~13 kHz

Typical Non-Contact cantilever


Material	: Silicon
Dimensions	: 125 µm X 30 µm
Force constant	: 42 N/m
Resonance freq	: ~320 kHz

Accessories

Cold cathode ion sputter source (ISE5)
Evaporator (EFM 3)

Test