The morphology of ceramic-metal nanocermet thin films is studied by surface sensitive x-ray scattering techniques.Grazing incidence small angle x-ray scattering (GISAXS) experiments carried out at LURE with a 2D detector show that metal clusters of nanometer size, known as nanoparticles, are dispersed in the thin film. Analyses of the x-ray reflectivity along with the diffuse scattering allow to predict the formation of layers of nanoparticles along the growth direction of the films. The formation of such cumulative disordered layers in one direction is likely to be related to the boundary condition in the reduced dimension.